Improved Bayesian image denoising based on wavelets with applications to electron microscopy

摘要

In this work we discuss an improvement of the image-denoising wavelet-based method presented by Bijaoui [Wavelets, Gaussian mixtures and Wiener filtering, Signal Process. 82 (2002) 709–712]. We show that the parameter estimation step can be replaced by a constrained nonlinear optimization. We propose three different methods to estimate the parameters. As in Bijaoui's original article, two of them deal with white noise. We show that the resulting algorithms improve the one originally proposed. Our third method extends the applicability of the denoising algorithm to colored noise. We test our algorithms with images simulating electron microscopy (EM) conditions as well as experimental EM images.