A note on order statistics-based parametric pattern classification

作者：

Highlights：

• We present the OS-based classification scheme for distributions in the exponential family.

• We show that CMOS using 2-OS attains the optimal Bayesian bound for symmetric distributions.

• We compare CMOS with the existing classification paradigms for asymmetric distributions.

摘要

Highlights•We present the OS-based classification scheme for distributions in the exponential family.•We show that CMOS using 2-OS attains the optimal Bayesian bound for symmetric distributions.•We compare CMOS with the existing classification paradigms for asymmetric distributions.

论文关键词：Pattern classification,Order Statistics (OS),Classification by Moments of Order Statistics (CMOS)

论文评审过程：Received 13 October 2013, Revised 22 June 2014, Accepted 24 July 2014, Available online 11 August 2014.

论文官网地址：https://doi.org/10.1016/j.patcog.2014.07.021