Syntactic pattern recognition for the recognition of bright spots
作者:
Highlights:
•
摘要
Syntactic pattern recognition techniques are applied to the analysis of one-dimensional seismic traces and two-dimensional seismograms for the detection of bright spots. The calculation between error probability and Levenshtein distance is proposed. The system for two-dimensional seismic analysis includes three kinds of string distance computation to test the continuity of a bright spot pattern.
论文关键词:Error probability,Bright spots,Levenshtein distance,Candidate bright spots,String distance,Amplitude-dependent encoding
论文评审过程:Received 7 December 1984, Accepted 5 March 1985, Available online 19 May 2003.
论文官网地址:https://doi.org/10.1016/0031-3203(85)90012-3