Parallel and consecutive-k-out-of-n:F systems under stochastic deterioration

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摘要

In this paper, we study parallel and consecutive-k-out-of-n:F systems consisting of components which are subject to random deterioration with time. The random deterioration in resistance of a component is defined through a stochastic process. We obtain lifetime distribution of a parallel system via classical probabilistic techniques. The lifetime distribution of a consecutive-k-out-of-n:F system is derived using the lifetime distribution of parallel systems and the concept of maximal signature. We also study the optimal replacement time for a parallel system. We present illustrative computational results using MATHCAD.

论文关键词:Consecutive-k-out-of-n:F system,Deterioration,Maximal signature,Parallel system,Reliability

论文评审过程:Available online 28 November 2013.

论文官网地址:https://doi.org/10.1016/j.amc.2013.10.081