An efficient method for texture defect detection: sub-band domain co-occurrence matrices

摘要

In this paper, an efficient algorithm, which combines concepts from wavelet theory and co-occurrence matrices, is presented for detection of defects encountered in textile images. Detection of defects within the inspected texture is performed first by decomposing the gray level images into sub-bands, then by partitioning the textured image into non-overlapping sub-windows and extracting the co-occurrence features and finally by classifying each sub-window as defective or non-defective with a Mahalanobis distance classifier being trained on defect free samples a priori. The experimental results demonstrating the use of this algorithm for the visual inspection of textile products obtained from the real factory environment are also presented. Experiments show that focusing on a particular band with high discriminatory power improves the detection performance as well as increases the computational efficiency.