Expert systems : Wick, M R and Slagle, J R ‘An examination facility for today's expert systems’ IEEE Expert Vol 4 No 1 (Spring 1989) pp 26–36
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论文评审过程：Available online 14 February 2003.
论文官网地址：https://doi.org/10.1016/0950-7051(90)90069-T
