Neural models and algorithms for digital testing: S T Chakradhar, V D Agrawal and M L Bushnell Kluwer Academic Publishers, UK (1991) £34.50, ISBN 0792391659, 184 pp
作者：
Highlights：
•
摘要
论文关键词：
论文评审过程：Available online 14 February 2003.
论文官网地址：https://doi.org/10.1016/0950-7051(91)90055-7
