DNNAttention: A deep neural network and attention based architecture for cross project defect number prediction

作者：

Highlights：

• Cross project defect number prediction.

• LSTM, attention layer.

• Transfer learning.

摘要

•Cross project defect number prediction.•LSTM, attention layer.•Transfer learning.

论文关键词：Cross project defect prediction,Deep neural network,Attention layer,Long short term memory (LSTM),Software defect number prediction

论文评审过程：Received 4 December 2020, Revised 31 August 2021, Accepted 25 September 2021, Available online 29 September 2021, Version of Record 5 October 2021.

论文官网地址：https://doi.org/10.1016/j.knosys.2021.107541