Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall

摘要

To deal with complex problems, structuring them through graphical representations and analyzing causal influences can aid in illuminating complex issues, systems, or concepts. The DEMATEL method is a methodology which can confirm interdependence among variables and aid in the development of a chart to reflect interrelationships between variables, and can be used for researching and solving complicated and intertwined problem groups. The end product of the DEMATEL process is a visual representation—the impact-relations map—by which respondents organize their own actions in the world. In order to obtain a suitable impact-relations map, an appropriate threshold value is needed to obtain adequate information for further analysis and decision-making. In the existing literature, the threshold value has been determined through interviews with respondents or judged by the researcher. In most cases, it is hard and time-consuming to aggregate the respondents and make a consistent decision. In addition, in order to avoid subjective judgments, a theoretical method to select the threshold value is necessary. In this paper, we propose a method based on the entropy approach, the maximum mean de-entropy algorithm, to achieve this purpose. Using a real case to find the interrelationships between the services of a Semiconductor Intellectual Property Mall as an example, we will compare the results obtained from the respondents and from our method, and show that the impact-relations maps from these two methods could be the same.