Manufacturing evaluation system based on AHP/ANP approach for wafer fabricating industry

摘要

The critical role played by manufacturing performance measurement systems in achieving competitive success is increasingly recognized. Manufacturing success may depend on the compatibility between a performance measurement system in operation at subordinate organizational levels and an organization’s global goals. Therefore, developing an integrated performance measurement model is significant for strategy management. This study proposes an integrated process that allows manufacturing systems to construct performance measurement model. Performance criteria from the literature and an expert questionnaire were utilized prior to building the performance measurement model. The analytical hierarchy process (AHP) and the analytical network process (ANP) are utilized to determine the weight of each criterion when generating the performance model for manufacturing systems.