Mining top-k co-occurrence items with sequential pattern

作者：

Highlights：

• The problem of mining top-k co-occurrence items with sequential pattern is defined.

• Sid-set and Sid-sets with an index are used to reduce the scanning time.

• Three algorithms including NAM, VAM, and VIAM for mining top-k co-occurrence items with sequential pattern are proposed.

• Two pruning techniques are proposed and used in VAM and VIAM algorithms to improve the processing time.

摘要

•The problem of mining top-k co-occurrence items with sequential pattern is defined.•Sid-set and Sid-sets with an index are used to reduce the scanning time.•Three algorithms including NAM, VAM, and VIAM for mining top-k co-occurrence items with sequential pattern are proposed.•Two pruning techniques are proposed and used in VAM and VIAM algorithms to improve the processing time.

论文关键词：Top-k mining,Co-occurrence sequential mining,Sequential pattern mining

论文评审过程：Received 25 January 2017, Revised 7 May 2017, Accepted 8 May 2017, Available online 10 May 2017, Version of Record 18 May 2017.

论文官网地址：https://doi.org/10.1016/j.eswa.2017.05.021