Extreme learning machine optimized by whale optimization algorithm using insulated gate bipolar transistor module aging degree evaluation

作者：

Highlights：

• Extreme learning machine optimized by whale optimization algorithm is proposed.

• An IGBT module aging degree evaluation model is presented.

• The accelerated aging test on IGBT module is carried to obtain the data.

• The algorithm proposed has better prediction accuracy than others.

摘要

•Extreme learning machine optimized by whale optimization algorithm is proposed.•An IGBT module aging degree evaluation model is presented.•The accelerated aging test on IGBT module is carried to obtain the data.•The algorithm proposed has better prediction accuracy than others.

论文关键词：Insulated gate bipolar transistor module,Aging degree evaluation,Extreme learning machine,Whale optimization algorithm

论文评审过程：Received 18 June 2018, Revised 2 March 2019, Accepted 2 March 2019, Available online 4 March 2019, Version of Record 8 March 2019.

论文官网地址：https://doi.org/10.1016/j.eswa.2019.03.002