Detecting anomalies in X-ray diffraction images using convolutional neural networks

作者：

Highlights：

• End-to-end anomaly detection system for X-ray diffraction images.

• Beam center detection algorithm.

• Comparison of three alternative image representation approaches.

• Open multi-label classification dataset of 6,311 diffraction images.

摘要

•End-to-end anomaly detection system for X-ray diffraction images.•Beam center detection algorithm.•Comparison of three alternative image representation approaches.•Open multi-label classification dataset of 6,311 diffraction images.

论文关键词：X-ray diffraction image,Multi-label classification,Convolutional neural network,Image recognition,Crystallography

论文评审过程：Received 14 February 2020, Revised 1 January 2021, Accepted 14 February 2021, Available online 23 February 2021, Version of Record 15 March 2021.

论文官网地址：https://doi.org/10.1016/j.eswa.2021.114740