Multi-failure detection using device hierarchical attention network

作者：

Highlights：

• A network model is proposed to predict multi-device failure in a data center.

• A helpful and relevant device subset can be obtained to predict failure.

• Our model has excellent performance due to use of relevant device information.

摘要

•A network model is proposed to predict multi-device failure in a data center.•A helpful and relevant device subset can be obtained to predict failure.•Our model has excellent performance due to use of relevant device information.

论文关键词：Attention mechanism,Data center,Deep learning,Hierarchical structure,Multi-failure detection

论文评审过程：Received 23 December 2020, Revised 12 April 2022, Accepted 18 April 2022, Available online 22 April 2022, Version of Record 10 May 2022.

论文官网地址：https://doi.org/10.1016/j.eswa.2022.117277