Multi-scale GAN with transformer for surface defect inspection of IC metal packages

作者：

Highlights：

• An AOI system is developed for surface defect inspection of IC metal packages.

• Multi-scale GAN with transformer is designed to adaptively generate templates.

• A multi-scale loss function is designed to ensure the network convergence.

• Several multi-scale schemes are proposed for defect inspection at multiple scales.

• Achieve inspection performance with error rate of 0.70% and omission rate of 0.57%.

摘要

•An AOI system is developed for surface defect inspection of IC metal packages.•Multi-scale GAN with transformer is designed to adaptively generate templates.•A multi-scale loss function is designed to ensure the network convergence.•Several multi-scale schemes are proposed for defect inspection at multiple scales.•Achieve inspection performance with error rate of 0.70% and omission rate of 0.57%.

论文关键词：Surface defect inspection,IC metal package,Multi-scale GAN with transformer,Multi-scale inspection schemes

论文评审过程：Received 22 March 2022, Revised 12 August 2022, Accepted 4 September 2022, Available online 10 September 2022, Version of Record 19 September 2022.

论文官网地址：https://doi.org/10.1016/j.eswa.2022.118788