Reliable and Efficient Pattern Matching Using an Affine Invariant Metric
作者:Michiel Hagedoorn, Remco C. Veltkamp
摘要
We present a new pattern similarity measure that behaves well under affine transformations. Our similarity measure is useful for pattern matching since it is defined on patterns with multiple components, satisfies the metric properties, is invariant under affine transformations, and is robust with respect to perturbation and occlusion. We give an algorithm, based on hierarchical subdivision of transformation space, which minimises our measure under the group of affine transformations, given two patterns. In addition, we present results obtained using an implementation of this algorithm.
论文关键词:geometric pattern matching, metric, affine invariance
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论文官网地址:https://doi.org/10.1023/A:1008022116857